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- 1. 心臓植込み型電子デバイス:長期に及ぶ合併症cardiac implantable electronic devices long term complications [show details]
… Electronic circuit failure can result from electrical overstress damage to the high voltage hybrid circuit and other electronic components .… differences among lead models, varying patient and clinician characteristics, and limitations of methods for detection of lead malfunction . Contemporary CIED and lead systems are generally labeled magnetic … management and behavior are variable among manufacturers/models and require some evaluation prior to scanning. Systems with older leads, abandoned leads, and some unusual features may not be strictly labeled …
- 2. 青年の健康管理における機密保持confidentiality in adolescent health care [show details]
… prevent "hacking" into the electronic medical record by unauthorized individuals . In addition, confidential electronic records should be reviewed by… to payment for health care services depends to some extent upon who is liable for payment and the method of payment. Treatment for which a nonemancipated minor consents is often the financial responsibility…
- 3. 成人の肝肺症候群:有病率、原因、臨床症状、診断hepatopulmonary syndrome in adults prevalence causes clinical manifestations and diagnosis [show details]
…because it is more sensitive than other methods and less invasive than pulmonary arteriography . The 100 percent oxygen method and radionuclide perfusion scanning can be used as alternatives for measuring …
- 4. 分化型甲状腺癌:放射性ヨード治療differentiated thyroid cancer radioiodine treatment [show details]
… (CT) scans contains a large iodine load and may interfere with radioiodine scanning and therapy for several months. Radioiodine uptake by thyroid tissue is stimulated by TSH. There are two methods for …
- 5. 肺の高分解能CThigh resolution computed tomography of the lungs [show details]
…Conventional helical CT scanning is the preferred method for the detection and evaluation of mediastinal disease, rather than HRCT . Multislice, multidetector-row CT scanning employs routinely thin sections …
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- 1. はじめに. 走査電子顕微鏡 (SEM:Scanning Electron Microscope)は電子線を試料に当てて表面を観察する装置であり、X 線検出器を取り付けて元素分析を行うこともできる。. 図1に、スギ花粉の光学顕微鏡画像とSEM 画像を比較して示す。. このように、SEM は光学顕微鏡 ...
- 走査電子顕微鏡 (SEM)は「試料に電子線を照射することで、ナノメートルオーダーの微小な表面構造を観察する装置・方法」です。. 光学顕微鏡では光の波長よりも小さな物質を観察することはでききず、μmオーダーのものしか観察できません。. SEMで ...
- [SEM]走査電子顕微鏡法の 分析事例はこちらからご覧ください。 特徴 SEMは、電子線を試料に当てた際に試料から出てくる電子の情報を基に、試料の凹凸や組成の違いによるコントラストを得ることができる手法です。 高倍率観察(50万 ...
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